Scan cell is one of the DFT technique , to test the sequential circuits in the Asic/Soc design. Normal D flip flop are converted to
Tag: DFT
Untestable faults in DFT
Faults list in design are categorized into sub categories. Faults class are mainly divided into Testable(TE)–> Faults can be tested by some patterns. Untestable(UT)–> Faults
Types of DFT Logic
Design for Testability circuit is used for controllability and observability of the design. The test logic is inserted in to the main core logic for
T3 Violation in DFT
Pattern are generated on the DFT logic inserted design, before generating the pattern the tool will check for certain rules and reports DRC violations as
Test coverage, Fault coverage
Test coverage and Fault coverage are the two important quantities which measures how good the DFT logic was implemented on core design for controllability and
Design For Testability
DFT means Design for testability, where logic will be implemented or inserted in the core design at RTL stage(Now a days most of the company